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Information card for entry 7035766
Preview
| Coordinates | 7035766.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | NiHttfasbz |
|---|---|
| Formula | C24 H19 F3 N4 Ni S5 |
| Calculated formula | C24 H19 F3 N4 Ni S5 |
| SMILES | [Ni]123[N](N=C(S2)SCc2ccccc2)=C(CC(=N[N]3=C(SCc2ccccc2)S1)c1sccc1)C(F)(F)F |
| Title of publication | A nickel complex of a conjugated bis-dithiocarbazate Schiff base for the photocatalytic production of hydrogen. |
| Authors of publication | Wise, Catherine F.; Liu, Dan; Mayer, Kathryn J.; Crossland, Patrick M.; Hartley, Carolyn L.; McNamara, William R. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 32 |
| Pages of publication | 14265 - 14271 |
| a | 8.8108 ± 0.0003 Å |
| b | 31.9395 ± 0.0009 Å |
| c | 27.7375 ± 0.0008 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 7805.7 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0224 |
| Residual factor for significantly intense reflections | 0.0218 |
| Weighted residual factors for significantly intense reflections | 0.0547 |
| Weighted residual factors for all reflections included in the refinement | 0.055 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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