Information card for entry 7035850

Structure parameters

• Formula: C32 H54 Cu N4 P Si2
• Calculated formula: C32 H54 Cu N4 P Si2
• Title of publication: Enhanced thermal stability of Cu-silylphosphido complexes via NHC ligation.
• Authors of publication: Khalili Najafabadi, Bahareh; Corrigan, John F.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 32
• Pages of publication: 14235 - 14241
• a: 9.611 ± 0.004 Å
• b: 20.206 ± 0.008 Å
• c: 20.631 ± 0.006 Å
• α: 102.042 ± 0.013°
• β: 89.995 ± 0.009°
• γ: 96.848 ± 0.008°
• Cell volume: 3889 ± 3 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1476
• Residual factor for significantly intense reflections: 0.128
• Weighted residual factors for significantly intense reflections: 0.331
• Weighted residual factors for all reflections included in the refinement: 0.3411
• Goodness-of-fit parameter for all reflections included in the refinement: 1.323
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No