Information card for entry 7035853

Structure parameters

• Formula: C40 H62 Cu N2 P Si2
• Calculated formula: C40 H62 Cu N2 P Si2
• SMILES: [Cu](P([Si](C)(C)C)[Si](C)(C)C)=C1N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C.c1(ccccc1)C
• Title of publication: Enhanced thermal stability of Cu-silylphosphido complexes via NHC ligation.
• Authors of publication: Khalili Najafabadi, Bahareh; Corrigan, John F.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 32
• Pages of publication: 14235 - 14241
• a: 22.988 ± 0.007 Å
• b: 10.325 ± 0.003 Å
• c: 18.132 ± 0.004 Å
• α: 90°
• β: 94.917 ± 0.008°
• γ: 90°
• Cell volume: 4288 ± 2 ų
• Cell temperature: 110 K
• Ambient diffraction temperature: 110 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.1145
• Residual factor for significantly intense reflections: 0.0925
• Weighted residual factors for significantly intense reflections: 0.252
• Weighted residual factors for all reflections included in the refinement: 0.263
• Goodness-of-fit parameter for all reflections included in the refinement: 1.11
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No