Information card for entry 7036178

Structure parameters

• Formula: C52 H64 N2 O14 Si2 W2
• Calculated formula: C52 H64 N2 O14 Si2 W2
• SMILES: [W]([n]1ccc(/C=C/c2cc(OCCO[Si](C(C)C)(C(C)C)C(C)C)c(cc2OCCO[Si](C(C)C)(C(C)C)C(C)C)/C=C/c2cc[n]([W](C#[O])(C#[O])(C#[O])(C#[O])C#[O])cc2)cc1)(C#[O])(C#[O])(C#[O])(C#[O])C#[O]
• Title of publication: Synthesis and structural analysis of tungsten-carbonyl dimers bridged with oligo(2,5-dialkoxy-1,4-phenylene vinylene)s through pyridine coordination.
• Authors of publication: Yorsaeng, Sakkawet; Tsutsumi, Ken; Kitiyanan, Boonyarach; Nomura, Kotohiro
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 38
• Pages of publication: 16728 - 16736
• a: 7.7881 ± 0.0014 Å
• b: 28.597 ± 0.005 Å
• c: 13.292 ± 0.002 Å
• α: 90°
• β: 101.79 ± 0.005°
• γ: 90°
• Cell volume: 2897.9 ± 0.8 ų
• Cell temperature: 93 K
• Ambient diffraction temperature: 93 K
• Number of distinct elements: 6
• Space group number: 4
• Hermann-Mauguin space group symbol: P 1 21 1
• Hall space group symbol: P 2yb
• Residual factor for all reflections: 0.0391
• Residual factor for significantly intense reflections: 0.0362
• Weighted residual factors for significantly intense reflections: 0.0882
• Weighted residual factors for all reflections included in the refinement: 0.0891
• Goodness-of-fit parameter for all reflections included in the refinement: 0.851
• Diffraction radiation wavelength: 0.71075 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No