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Information card for entry 7036278
Preview
| Coordinates | 7036278.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H44 N2 Ni |
|---|---|
| Calculated formula | C30 H44 N2 Ni |
| SMILES | C1(C(C)=[N]([Ni]2([N]=1c1c(cccc1C(C)C)C(C)C)[CH2]=[CH2]2)c1c(cccc1C(C)C)C(C)C)C |
| Title of publication | α-Diimine nickel complexes of ethylene and related alkenes. |
| Authors of publication | Zhao, Yanxia; Wang, Zeyi; Jing, Xiaojing; Dong, Qingsong; Gong, Shida; Li, Qian-Shu; Zhang, Juan; Wu, Biao; Yang, Xiao-Juan |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 37 |
| Pages of publication | 16228 - 16232 |
| a | 16.404 ± 0.003 Å |
| b | 9.3422 ± 0.0018 Å |
| c | 19.045 ± 0.004 Å |
| α | 90° |
| β | 93.067 ± 0.002° |
| γ | 90° |
| Cell volume | 2914.5 ± 1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0353 |
| Residual factor for significantly intense reflections | 0.0319 |
| Weighted residual factors for significantly intense reflections | 0.0885 |
| Weighted residual factors for all reflections included in the refinement | 0.091 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.068 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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