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Information card for entry 7036305
Preview
Coordinates | 7036305.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H42 Rh2 S4 |
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Calculated formula | C40 H42 Rh2 S4 |
SMILES | c12cccc3cccc(S[Rh]45678([S]1[Rh]19%10%11%12([S]8c8cccc%13cccc(S1)c8%13)[c]1([c]%12([c]%11([c]%10([c]91C)C)C)C)C)[c]1([c]7([c]6([c]5([c]41C)C)C)C)C)c23 |
Title of publication | Structural diversity of bimetallic rhodium and iridium half sandwich dithiolato complexes. |
Authors of publication | Nejman, Phillip S.; Morton-Fernandez, Brian; Moulding, David J.; Athukorala Arachchige, Kasun S.; Cordes, David B.; Slawin, Alexandra M. Z.; Kilian, Petr; Woollins, J. Derek |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2015 |
Journal volume | 44 |
Journal issue | 38 |
Pages of publication | 16758 - 16766 |
a | 9.912 ± 0.004 Å |
b | 16.351 ± 0.007 Å |
c | 10.915 ± 0.005 Å |
α | 90° |
β | 90.662 ± 0.012° |
γ | 90° |
Cell volume | 1768.9 ± 1.3 Å3 |
Cell temperature | 93 K |
Ambient diffraction temperature | 93 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0851 |
Residual factor for significantly intense reflections | 0.0665 |
Weighted residual factors for significantly intense reflections | 0.158 |
Weighted residual factors for all reflections included in the refinement | 0.1653 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.842 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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