Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7036545
Preview
| Coordinates | 7036545.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H40 Cu2 N8 O23 V2 W4 |
|---|---|
| Calculated formula | C48 H32 Cu2 N8 O23 V2 W4 |
| Title of publication | Co-sensitization promoted light harvesting with a new mixed-addenda polyoxometalate [Cu(C12H8N2)2]2[V2W4O19]·4H2O in dye-sensitized solar cells. |
| Authors of publication | Xu, Sha-Sha; Chen, Wei-Lin; Wang, Yan-Hua; Li, Yang-Guang; Liu, Zhu-Jun; Shan, Chun-Hui; Su, Zhong-Min; Wang, En-Bo |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 42 |
| Pages of publication | 18553 - 18562 |
| a | 27.888 ± 0.003 Å |
| b | 15.5043 ± 0.0016 Å |
| c | 14.6345 ± 0.0015 Å |
| α | 90° |
| β | 117.038 ± 0.001° |
| γ | 90° |
| Cell volume | 5636.1 ± 1 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0685 |
| Residual factor for significantly intense reflections | 0.0564 |
| Weighted residual factors for significantly intense reflections | 0.1482 |
| Weighted residual factors for all reflections included in the refinement | 0.1551 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.077 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7036545.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.