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Information card for entry 7037995
Preview
Coordinates | 7037995.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Tetraethyl Ammonium Fluoride complex of Vasarene [4] |
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Formula | C34 H40 F N O9 |
Calculated formula | C34 H40 F N O9 |
SMILES | c1c2[C@@]3(C(=O)c4ccccc4[C@]3(O)Oc2cc2c1[C@]1([C@](c3ccccc3C1=O)(O2)O)O)O.C(C)[N+](CC)(CC)CC.CCO.[F-] |
Title of publication | Selective recognition of fluoride salts by vasarenes: a key role of a self-assembled in situ dimeric entity via an exceptionally short [O-H-O](-) H-bond. |
Authors of publication | Bengiat, R.; Gil, M.; Klein, A.; Bogoslavsky, B.; Cohen, S.; Dubnikova, F.; Yardeni, G.; Zilbermann, I.; Almog, J. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2016 |
Journal volume | 45 |
Journal issue | 21 |
Pages of publication | 8734 - 8739 |
a | 9.5145 ± 0.0007 Å |
b | 16.653 ± 0.001 Å |
c | 9.5978 ± 0.0007 Å |
α | 90° |
β | 94.788 ± 0.001° |
γ | 90° |
Cell volume | 1515.42 ± 0.18 Å3 |
Cell temperature | 173 ± 1 K |
Ambient diffraction temperature | 173 ± 1 K |
Number of distinct elements | 5 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0556 |
Residual factor for significantly intense reflections | 0.0527 |
Weighted residual factors for significantly intense reflections | 0.1275 |
Weighted residual factors for all reflections included in the refinement | 0.1294 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.135 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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