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Information card for entry 7040242
Preview
Coordinates | 7040242.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H34 Cl2 N5 O2 P Pd S2 Sn |
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Calculated formula | C40 H34 Cl2 N5 O2 P Pd S2 Sn |
SMILES | [Pd]12([Sn]34(Oc5c(N4C(=O)c4[n]3ccn4C)cccc5)([n]3c(S1)cccc3)[n]1c(S2)cccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1.ClCCl |
Title of publication | Group 10-group 14 metal complexes [E-TM](IV): the role of the group 14 site as an L, X and Z-type ligand. |
Authors of publication | Wächtler, Erik; Gericke, Robert; Brendler, Erica; Gerke, Birgit; Langer, Thorsten; Pöttgen, Rainer; Zhechkov, Lyuben; Heine, Thomas; Wagler, Jörg |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2016 |
Journal volume | 45 |
Journal issue | 36 |
Pages of publication | 14252 - 14264 |
a | 11.5645 ± 0.0004 Å |
b | 12.0423 ± 0.0004 Å |
c | 15.0296 ± 0.0004 Å |
α | 80.499 ± 0.003° |
β | 73.274 ± 0.002° |
γ | 84.786 ± 0.003° |
Cell volume | 1974.93 ± 0.11 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 9 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0289 |
Residual factor for significantly intense reflections | 0.0217 |
Weighted residual factors for significantly intense reflections | 0.0482 |
Weighted residual factors for all reflections included in the refinement | 0.0501 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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