Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7040659
Preview
Coordinates | 7040659.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H42 Cl N2 P Ru |
---|---|
Calculated formula | C30 H42 Cl N2 P Ru |
SMILES | [Ru]123456(Cl)([N](c7ccc(cc7)C)=P(N1c1ccc(cc1)C)(CC)CC)[c]1([c]2([c]6([c]5([c]4([c]31C)C)C)C)C)C |
Title of publication | The half-sandwich 18- and 16-electron arene ruthenium iminophosphonamide complexes. |
Authors of publication | Peganova, Tat'yana A.; Sinopalnikova, Iana S.; Peregudov, Alexander S.; Fedyanin, Ivan V.; Demonceau, Albert; Ustynyuk, Nikolai A.; Kalsin, Alexander M. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2016 |
Journal volume | 45 |
Journal issue | 42 |
Pages of publication | 17030 - 17041 |
a | 9.89 ± 0.003 Å |
b | 36.718 ± 0.009 Å |
c | 8.509 ± 0.002 Å |
α | 90° |
β | 113.639 ± 0.007° |
γ | 90° |
Cell volume | 2830.7 ± 1.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0579 |
Residual factor for significantly intense reflections | 0.0385 |
Weighted residual factors for significantly intense reflections | 0.0774 |
Weighted residual factors for all reflections included in the refinement | 0.0835 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7040659.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.