Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7040935
Preview
Coordinates | 7040935.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C22 H30 Fe O2 |
---|---|
Calculated formula | C22 H30 Fe O2 |
SMILES | [c]12([c]3([c]4([c]5([c]1(C)[Fe]16782345[c]2([c]1([c]6([c]7([c]82C)C)C)C)C(=O)C)C)C)C)C(=O)C |
Title of publication | 1,1'-Diacetyloctamethylferrocene: an overlooked and overdue synthon leading to the facile synthesis of an octamethylferrocenophane. |
Authors of publication | Roemer, Max; Skelton, Brian W.; Piggott, Matthew J.; Koutsantonis, George A. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2016 |
Journal volume | 45 |
Journal issue | 47 |
Pages of publication | 18817 - 18821 |
a | 13.813 ± 0.0002 Å |
b | 9.9015 ± 0.0002 Å |
c | 13.7349 ± 0.0003 Å |
α | 90° |
β | 95.262 ± 0.001° |
γ | 90° |
Cell volume | 1870.6 ± 0.06 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0307 |
Residual factor for significantly intense reflections | 0.028 |
Weighted residual factors for significantly intense reflections | 0.0717 |
Weighted residual factors for all reflections included in the refinement | 0.074 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7040935.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.