Information card for entry 7041029

Structure parameters

• Formula: C52 H44 O4 Sn2
• Calculated formula: C52 H44 O4 Sn2
• SMILES: C(O[Sn]1[O](C(c2ccccc2)c2ccccc2)[Sn](OC(c2ccccc2)c2ccccc2)[O]1C(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1
• Title of publication: Aerosol-assisted CVD of SnO from stannous alkoxide precursors.
• Authors of publication: Hill, Michael S.; Johnson, Andrew L.; Lowe, John P.; Molloy, Kieran C.; Parish, James D.; Wildsmith, Thomas; Kingsley, Andrew L.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2016
• Journal volume: 45
• Journal issue: 45
• Pages of publication: 18252 - 18258
• a: 9.7376 ± 0.0007 Å
• b: 10.0924 ± 0.0006 Å
• c: 12.1457 ± 0.0009 Å
• α: 77.187 ± 0.006°
• β: 68.707 ± 0.007°
• γ: 87.128 ± 0.006°
• Cell volume: 1083.84 ± 0.14 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0676
• Residual factor for significantly intense reflections: 0.0512
• Weighted residual factors for significantly intense reflections: 0.1206
• Weighted residual factors for all reflections included in the refinement: 0.1317
• Goodness-of-fit parameter for all reflections included in the refinement: 1.04
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No