Information card for entry 7041393
| Formula |
C14 H39 B2 F8 N Ni P4 |
| Calculated formula |
C14 H39 B2 F8 N Ni P4 |
| Title of publication |
Spontaneous Si-C bond cleavage in (Triphos(Si))-nickel complexes. |
| Authors of publication |
Petuker, Anette; Mebs, Stefan; Schuth, Nils; Gerschel, Philipp; Reback, Matthew L.; Mallick, Bert; van Gastel, Maurice; Haumann, Michael; Apfel, Ulf-Peter |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2017 |
| Journal volume |
46 |
| Journal issue |
3 |
| Pages of publication |
907 - 917 |
| a |
10.1498 ± 0.0003 Å |
| b |
16.0585 ± 0.0006 Å |
| c |
19.1814 ± 0.0007 Å |
| α |
90° |
| β |
121.948 ± 0.002° |
| γ |
90° |
| Cell volume |
2652.83 ± 0.17 Å3 |
| Cell temperature |
108 ± 2 K |
| Ambient diffraction temperature |
108.2 ± 0.6 K |
| Number of distinct elements |
7 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.051 |
| Residual factor for significantly intense reflections |
0.046 |
| Weighted residual factors for significantly intense reflections |
0.12 |
| Weighted residual factors for all reflections included in the refinement |
0.1244 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.042 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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https://www.crystallography.net/7041393.html