Information card for entry 7041549
| Chemical name |
MoO2(R-AMD)2 (AMD = N,N?-di-R-acetamidinate) R = cyclohexyl |
| Formula |
C28 H50 Mo N4 O2 |
| Calculated formula |
C28 H50 Mo N4 O2 |
| SMILES |
[Mo]12(=O)([N](=C(C)N2C2CCCCC2)C2CCCCC2)(=O)[N](C2CCCCC2)=C(N1C1CCCCC1)C |
| Title of publication |
Second-generation hexavalent molybdenum oxo-amidinate precursors for atomic layer deposition. |
| Authors of publication |
Jurca, T.; Peters, A. W.; Mouat, A. R.; Farha, O. K.; Hupp, J. T.; Lohr, T. L.; Delferro, M.; Marks, T. J. |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2017 |
| Journal volume |
46 |
| Journal issue |
4 |
| Pages of publication |
1172 - 1178 |
| a |
11.4715 ± 0.0002 Å |
| b |
11.6621 ± 0.0002 Å |
| c |
21.5619 ± 0.0005 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2884.59 ± 0.1 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100.06 K |
| Number of distinct elements |
5 |
| Space group number |
33 |
| Hermann-Mauguin space group symbol |
P n a 21 |
| Hall space group symbol |
P 2c -2n |
| Residual factor for all reflections |
0.0745 |
| Residual factor for significantly intense reflections |
0.0491 |
| Weighted residual factors for significantly intense reflections |
0.1172 |
| Weighted residual factors for all reflections included in the refinement |
0.1336 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.79 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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