Information card for entry 7041560

Structure parameters

• Formula: C53 H84 Eu2 Si2
• Calculated formula: C53 H84 Eu2 Si2
• SMILES: [C]12([Si](C(C)C)(C(C)C)C(C)C)=[CH]3[CH]4=[C]567[C]81(=[CH]1[CH]9=[C]5([Si](C(C)C)(C(C)C)C(C)C)[Eu]5%10%11%127189[c]1([c]%10([c]%11([c]%12([c]51C)C)C)C)C)[Eu]15782346[c]2([c]5([c]7([c]8([c]12C)C)C)C)C.c1ccc(cc1)C
• Title of publication: A base-free synthetic route to anti-bimetallic lanthanide pentalene complexes.
• Authors of publication: Kilpatrick, Alexander F. R.; Cloke, F Geoffrey N
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2017
• Journal volume: 46
• Journal issue: 17
• Pages of publication: 5587 - 5597
• a: 16.829 ± 0.0003 Å
• b: 15.4443 ± 0.0002 Å
• c: 20.1752 ± 0.0003 Å
• α: 90°
• β: 99.8178 ± 0.0015°
• γ: 90°
• Cell volume: 5166.98 ± 0.14 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173.15 K
• Number of distinct elements: 4
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0575
• Residual factor for significantly intense reflections: 0.0532
• Weighted residual factors for significantly intense reflections: 0.1262
• Weighted residual factors for all reflections included in the refinement: 0.1308
• Goodness-of-fit parameter for all reflections included in the refinement: 1.072
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No