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Information card for entry 7041627
Preview
| Coordinates | 7041627.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C33 H39 F Si Sn3 |
|---|---|
| Calculated formula | C33 H39 F Si Sn3 |
| SMILES | [Sn](C#Cc1c([Si](F)(c2ccccc2C#C[Sn](C)(C)C)c2ccccc2C#C[Sn](C)(C)C)cccc1)(C)(C)C |
| Title of publication | Tridentate Lewis-acids based on triphenylsilane. |
| Authors of publication | Tomaschautzky, Janek; Neumann, Beate; Stammler, Hans-Georg; Mix, Andreas; Mitzel, Norbert W. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2017 |
| Journal volume | 46 |
| Journal issue | 5 |
| Pages of publication | 1645 - 1659 |
| a | 12.80666 ± 0.00009 Å |
| b | 41.3809 ± 0.0002 Å |
| c | 13.17067 ± 0.00013 Å |
| α | 90° |
| β | 90.2126 ± 0.0007° |
| γ | 90° |
| Cell volume | 6979.76 ± 0.09 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0394 |
| Residual factor for significantly intense reflections | 0.0376 |
| Weighted residual factors for significantly intense reflections | 0.0937 |
| Weighted residual factors for all reflections included in the refinement | 0.0955 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7041627.html
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Users of the data should acknowledge the original authors of the
structural data.