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Information card for entry 7042264
Preview
Coordinates | 7042264.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H52 I2 Mg2 N2 O2 Si2 |
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Calculated formula | C44 H52 I2 Mg2 N2 O2 Si2 |
SMILES | c12cccc3c1c(ccc3)[N]1([Mg](I)([N]2([Si](C)(c2ccccc2)c2ccccc2)[Mg]1(I)[O](CC)CC)[O](CC)CC)[Si](C)(c1ccccc1)c1ccccc1 |
Title of publication | 1,8-Bis(silylamido)naphthalene complexes of magnesium and zinc synthesised through alkane elimination reactions. |
Authors of publication | Bradley, Mark A.; Birchall, Chris; Blake, Alexander J.; Lewis, William; Moxey, Graeme J.; Kays, Deborah L. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2017 |
Journal volume | 46 |
Journal issue | 12 |
Pages of publication | 4101 - 4110 |
a | 20.2536 ± 0.0007 Å |
b | 10.19 ± 0.0003 Å |
c | 21.7038 ± 0.0007 Å |
α | 90° |
β | 93.943 ± 0.003° |
γ | 90° |
Cell volume | 4468.7 ± 0.2 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 90 ± 2 K |
Number of distinct elements | 7 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0508 |
Residual factor for significantly intense reflections | 0.0502 |
Weighted residual factors for significantly intense reflections | 0.1465 |
Weighted residual factors for all reflections included in the refinement | 0.1473 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.065 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7042264.html
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