Information card for entry 7043456
| Formula |
C40 H46 Cd3 N8 O14 |
| Calculated formula |
C40 H46 Cd3 N8 O14 |
| SMILES |
c12c(cccc1C=[N]1CC[NH]3CC[N]4=Cc5c6[O]7[Cd]89([O]2[Cd]1347ON(=O)=O)([O](c6ccc5)C)[O]1c2c(cccc2C=[N]2CC[NH]3CC[N]4=Cc5cccc([O]8C)c5[O]9[Cd]1234ON(=O)=O)OC)OC |
| Title of publication |
A Schiff base platform: structures, sensing of Zn(II), PPi in aqueous medium and anticancer activity |
| Authors of publication |
Naskar, Barnali; Modak, Ritwik; Maiti, Dilip K.; Drew, Michael G.B; Bauza, Antonio; Frontera, Antonio; Das Mukhopadhyay, Chitrangada; Mishra, Snehasis; Das Saha, Krishna; Goswami, Sanchita |
| Journal of publication |
Dalton Trans. |
| Year of publication |
2017 |
| a |
22.4096 ± 0.0008 Å |
| b |
12.5242 ± 0.0004 Å |
| c |
16.1728 ± 0.0007 Å |
| α |
90° |
| β |
106.738 ± 0.004° |
| γ |
90° |
| Cell volume |
4346.8 ± 0.3 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0547 |
| Residual factor for significantly intense reflections |
0.0454 |
| Weighted residual factors for significantly intense reflections |
0.0953 |
| Weighted residual factors for all reflections included in the refinement |
0.0993 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.076 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/7043456.html