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Information card for entry 7043492
Preview
| Coordinates | 7043492.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37 H58 Cl N2 O3 V |
|---|---|
| Calculated formula | C37 H58 Cl N2 O3 V |
| SMILES | [V]123(Cl)(Oc4c(C(C)(C)C)cc(C(C)(C)C)cc4C[N]3(C[C@H]3[N]2(CC)CCC3)Cc2c(O1)c(cc(C(C)(C)C)c2)C(C)(C)C)=O |
| Title of publication | Radical reactions of diamine bis(phenolate) vanadium(III) complexes. Solid state binding of O2 to form a vanadium(V) peroxo complex |
| Authors of publication | Barroso, Sonia; Coelho, Ana M.; Adão, Pedro; Calhorda, Maria Jose; Martins, Ana M. |
| Journal of publication | Dalton Trans. |
| Year of publication | 2017 |
| a | 9.997 ± 0.002 Å |
| b | 12.56 ± 0.003 Å |
| c | 28.755 ± 0.006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3610.5 ± 1.4 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.1292 |
| Residual factor for significantly intense reflections | 0.0546 |
| Weighted residual factors for significantly intense reflections | 0.0848 |
| Weighted residual factors for all reflections included in the refinement | 0.0978 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.934 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7043492.html
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