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Information card for entry 7044506
Preview
| Coordinates | 7044506.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C57 H49 Cl4 O P3 Ru Si |
|---|---|
| Calculated formula | C57 H49 Cl4 O P3 Ru Si |
| SMILES | [RuH]12([P](c3c([SiH]2c2ccccc2[P]1(c1ccccc1)c1ccccc1)cccc3)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)C#[O].ClCCl.ClCCl |
| Title of publication | Silylene-assisted hydride transfer to CO2 and CS2 at a [P2Si]Ru pincer-type complex |
| Authors of publication | Whited, Matthew T.; Zhang, Jia; Ma, Senjie; Nguyen, Binh D.; Janzen, Daron E. |
| Journal of publication | Dalton Trans. |
| Year of publication | 2017 |
| a | 12.5608 ± 0.001 Å |
| b | 17.3752 ± 0.0014 Å |
| c | 23.586 ± 0.002 Å |
| α | 90° |
| β | 92.353 ± 0.006° |
| γ | 90° |
| Cell volume | 5143.2 ± 0.7 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173.15 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0768 |
| Residual factor for significantly intense reflections | 0.0489 |
| Weighted residual factors for significantly intense reflections | 0.0921 |
| Weighted residual factors for all reflections included in the refinement | 0.1008 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7044506.html
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