Information card for entry 7044762

Structure parameters

• Formula: C29 H45 Cl N5 Si2 Y
• Calculated formula: C29 H45 Cl N5 Si2 Y
• SMILES: [Y]123(Cl)(N(c4cccc5cccc([N]2=C(N3[Si](C)(C)C)c2ccccc2)c45)[Si](C)(C)C)[N](CC[N]1(C)C)(C)C
• Title of publication: Rare-earth metal-mediated PhC[triple bond, length as m-dash]N insertion into N,N-bis(trimethylsilyl)naphthalene-1,8-diamido dianion - a synthetic approach to complexes coordinated by ansa-bridged amido-amidinato ligand.
• Authors of publication: Lyubov, Dmitry M.; Cherkasov, Anton V.; Fukin, Georgy K.; Lyssenko, Konstantin A.; Rychagova, Elena A.; Ketkov, Sergey Yu; Trifonov, Alexander A.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2018
• Journal volume: 47
• Journal issue: 2
• Pages of publication: 438 - 451
• a: 8.7689 ± 0.0006 Å
• b: 11.2424 ± 0.0008 Å
• c: 17.336 ± 0.0012 Å
• α: 87.6876 ± 0.0015°
• β: 78.307 ± 0.0015°
• γ: 76.5725 ± 0.0014°
• Cell volume: 1627.8 ± 0.2 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0553
• Residual factor for significantly intense reflections: 0.0376
• Weighted residual factors for significantly intense reflections: 0.0822
• Weighted residual factors for all reflections included in the refinement: 0.0886
• Goodness-of-fit parameter for all reflections included in the refinement: 1.034
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No