Information card for entry 7044783
Formula |
Sc Te2 Tl0.96 |
Calculated formula |
Sc Te2 Tl0.961 |
Title of publication |
Thermoelectric properties and thermal stability of layered chalcogenides, TlScQ2, Q= Se, Te |
Authors of publication |
Aswathy, Vijayakumar Sajitha; Sankar, Cheriyedath Raj; Varma, Manoj Raama; Assoud, Abdeljalil; Bieringer, Mario; Kleinke, Holger |
Journal of publication |
Dalton Transactions |
Year of publication |
2017 |
a |
4.2133 ± 0.0002 Å |
b |
4.2133 ± 0.0002 Å |
c |
24.088 ± 0.002 Å |
α |
90° |
β |
90° |
γ |
120° |
Cell volume |
370.32 ± 0.04 Å3 |
Cell temperature |
298 ± 2 K |
Ambient diffraction temperature |
298 ± 2 K |
Number of distinct elements |
3 |
Space group number |
166 |
Hermann-Mauguin space group symbol |
R -3 m :H |
Hall space group symbol |
-R 3 2" |
Residual factor for all reflections |
0.028 |
Residual factor for significantly intense reflections |
0.028 |
Weighted residual factors for significantly intense reflections |
0.0792 |
Weighted residual factors for all reflections included in the refinement |
0.0792 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.215 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
No |
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https://www.crystallography.net/7044783.html