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Information card for entry 7045219
Preview
| Coordinates | 7045219.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Bi Cs3 O14 P4 Sr |
|---|---|
| Calculated formula | Bi Cs3 O14 P4 Sr |
| Title of publication | New complex phosphates Cs<sub>3</sub>M<sup>II</sup>Bi(P<sub>2</sub>O<sub>7</sub>)<sub>2</sub> (M<sup>II</sup> - Ca, Sr and Pb): synthesis, characterization, crystal and electronic structure. |
| Authors of publication | Zatovsky, Igor V.; Strutynska, Nataliia Yu; Hizhnyi, Yuriy A.; Baumer, Vyacheslav N.; Ogorodnyk, Ivan V.; Slobodyanik, Nikolay S.; Odynets, Ievgen V.; Klyui, N. I. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2018 |
| Journal volume | 47 |
| Journal issue | 7 |
| Pages of publication | 2274 - 2284 |
| a | 9.3978 ± 0.0003 Å |
| b | 9.6284 ± 0.0003 Å |
| c | 17.6552 ± 0.0005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1597.54 ± 0.08 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.041 |
| Residual factor for significantly intense reflections | 0.0314 |
| Weighted residual factors for significantly intense reflections | 0.0524 |
| Weighted residual factors for all reflections included in the refinement | 0.0571 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.114 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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