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Information card for entry 7048115
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Coordinates | 7048115.cif |
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Original paper (by DOI) | HTML |
Chemical name | bis[N,N-diethyl-N`-2-naphthoylthioureato] lead(II) |
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Formula | C32 H34 N4 O2 Pb S2 |
Calculated formula | C32 H34 N4 O2 Pb S2 |
Title of publication | Full compositional control of PbS<sub>x</sub>Se<sub>1-x</sub> thin films by the use of acylchalcogourato lead(ii) complexes as precursors for AACVD. |
Authors of publication | Ezenwa, Tagbo Emmanuel; McNaughter, Paul D.; Raftery, James; Lewis, David J.; O'Brien, Paul |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2018 |
Journal volume | 47 |
Journal issue | 47 |
Pages of publication | 16938 - 16943 |
a | 10.697 ± 0.0003 Å |
b | 10.8385 ± 0.0004 Å |
c | 26.5087 ± 0.0009 Å |
α | 90° |
β | 98.916 ± 0.002° |
γ | 90° |
Cell volume | 3036.27 ± 0.18 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0388 |
Residual factor for significantly intense reflections | 0.0348 |
Weighted residual factors for significantly intense reflections | 0.0916 |
Weighted residual factors for all reflections included in the refinement | 0.0938 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.151 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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