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Information card for entry 7048115
Preview
| Coordinates | 7048115.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | bis[N,N-diethyl-N`-2-naphthoylthioureato] lead(II) |
|---|---|
| Formula | C32 H34 N4 O2 Pb S2 |
| Calculated formula | C32 H34 N4 O2 Pb S2 |
| Title of publication | Full compositional control of PbS<sub>x</sub>Se<sub>1-x</sub> thin films by the use of acylchalcogourato lead(ii) complexes as precursors for AACVD. |
| Authors of publication | Ezenwa, Tagbo Emmanuel; McNaughter, Paul D.; Raftery, James; Lewis, David J.; O'Brien, Paul |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2018 |
| Journal volume | 47 |
| Journal issue | 47 |
| Pages of publication | 16938 - 16943 |
| a | 10.697 ± 0.0003 Å |
| b | 10.8385 ± 0.0004 Å |
| c | 26.5087 ± 0.0009 Å |
| α | 90° |
| β | 98.916 ± 0.002° |
| γ | 90° |
| Cell volume | 3036.27 ± 0.18 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0388 |
| Residual factor for significantly intense reflections | 0.0348 |
| Weighted residual factors for significantly intense reflections | 0.0916 |
| Weighted residual factors for all reflections included in the refinement | 0.0938 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.151 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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