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Information card for entry 7049811
Preview
Coordinates | 7049811.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C48 H70 N2 Na2 O4 Te4 U |
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Calculated formula | C48 H70 N2 Na2 O4 Te4 U |
SMILES | N(=[U]([Te]c1ccccc1)([Te]c1ccccc1)([Te]c1ccccc1)([Te]c1ccccc1)=NC(C)(C)C)C(C)(C)C.[O]1([Na][O]2CCCC2)CCCC1.[Na]([O]1CCCC1)[O]1CCCC1 |
Title of publication | Oxidation of uranium(iv) mixed imido-amido complexes with PhEEPh and to generate uranium(vi) bis(imido) dichalcogenolates, U(NR)<sub>2</sub>(EPh)<sub>2</sub>(L)<sub>2</sub>. |
Authors of publication | Tomson, Neil C.; Anderson, Nickolas H.; Tondreau, Aaron M.; Scott, Brian L.; Boncella, James M. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2019 |
Journal volume | 48 |
Journal issue | 29 |
Pages of publication | 10865 - 10873 |
a | 12.2409 ± 0.0016 Å |
b | 26.166 ± 0.003 Å |
c | 10.0543 ± 0.0013 Å |
α | 90° |
β | 103.477 ± 0.001° |
γ | 90° |
Cell volume | 3131.7 ± 0.7 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0385 |
Residual factor for significantly intense reflections | 0.0333 |
Weighted residual factors for significantly intense reflections | 0.064 |
Weighted residual factors for all reflections included in the refinement | 0.0651 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.192 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7049811.html
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