Information card for entry 7050188

Structure parameters

• Formula: C52 H46 Cl0 N2 O4 P2 Rh
• Calculated formula: C52 H46 N2 O4 P2 Rh
• SMILES: [Rh]12([P](c4ccccc4)(c4ccccc4)c4ccccc4)([P](c3ccccc3)(c3ccccc3)c3ccccc3)(N(=O)=C(c3c(O1)cccc3)C)[N](O)=C(c1c(O2)cccc1)C
• Title of publication: Synthesis, structure and electrochemical properties of some oxime complexes of rhodium
• Authors of publication: Acharyya, Rama; Basuli, Falguni; Rosair, Georgina; Bhattacharya, Samaresh
• Journal of publication: New Journal of Chemistry
• Year of publication: 2004
• Journal volume: 28
• Journal issue: 1
• Pages of publication: 115
• a: 11.168 ± 0.003 Å
• b: 17.158 ± 0.002 Å
• c: 23.129 ± 0.006 Å
• α: 90°
• β: 96.68 ± 0.02°
• γ: 90°
• Cell volume: 4401.9 ± 1.7 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.12
• Residual factor for significantly intense reflections: 0.0578
• Weighted residual factors for significantly intense reflections: 0.1113
• Weighted residual factors for all reflections included in the refinement: 0.1347
• Goodness-of-fit parameter for all reflections included in the refinement: 1.014
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No