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Information card for entry 7050596
Preview
| Coordinates | 7050596.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H28 Cl2 N4 O Zn |
|---|---|
| Calculated formula | C15 H28 Cl2 N4 O Zn |
| SMILES | [Zn]123(Cl)[NH]4Cc5ccccc5C[NH]1CC[NH]2CCC[NH]3CC4.[Cl-].O |
| Title of publication | Copper(II) and Zn(II) coordination chemistry of tetraaza[n]cyclophanes |
| Authors of publication | Martin Chadim; Pilar Díaz; Enrique García-España; Jana Hodacova; Peter C. Junk; Julio Latorre; José M. Llinares; Conxa Soriano; Jiri Zavada |
| Journal of publication | New J. Chem. |
| Year of publication | 2003 |
| Journal volume | 27 |
| Journal issue | 7 |
| Pages of publication | 1132 - 1139 |
| a | 7.105 ± 0.0002 Å |
| b | 11.219 ± 0.0003 Å |
| c | 12.264 ± 0.0004 Å |
| α | 98.202 ± 0.0011° |
| β | 95.208 ± 0.0011° |
| γ | 92.828 ± 0.0013° |
| Cell volume | 961.66 ± 0.05 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.048 |
| Residual factor for significantly intense reflections | 0.0361 |
| Weighted residual factors for significantly intense reflections | 0.1062 |
| Weighted residual factors for all reflections included in the refinement | 0.1169 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.877 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7050596.html
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