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Information card for entry 7050735
Preview
| Coordinates | 7050735.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C124 H104 Ag6 Cl4 F12 P10 Se4 |
|---|---|
| Calculated formula | C124 H104 Ag6 Cl4 F12 P10 Se4 |
| Title of publication | Synthesis, photophysics, and electrochemistry of hexanuclear silver(I) chalcogenolate complexes. X-Ray crystal structures of [Ag6(µ-dppm)4(µ3-SC6H4Me-p)4](PF6)2 and [Ag6(µ-dppm)4(µ3-SeC6H4Cl-p)4](PF6)2 |
| Authors of publication | Wing-Wah Yam, Vivian; Chung-Chin Cheng, Eddie; Zhu, Nianyong |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2002 |
| Journal volume | 26 |
| Journal issue | 3 |
| Pages of publication | 279 |
| a | 16.021 ± 0.002 Å |
| b | 16.021 ± 0.002 Å |
| c | 27.512 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 7061.6 ± 1.6 Å3 |
| Cell temperature | 301 ± 2 K |
| Ambient diffraction temperature | 301 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 82 |
| Hermann-Mauguin space group symbol | I -4 |
| Hall space group symbol | I -4 |
| Residual factor for all reflections | 0.0507 |
| Residual factor for significantly intense reflections | 0.0374 |
| Weighted residual factors for significantly intense reflections | 0.0984 |
| Weighted residual factors for all reflections included in the refinement | 0.1112 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.042 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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