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Information card for entry 7051795
Preview
Coordinates | 7051795.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H56 Ag4 Cl4 N4 O16 S6 |
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Calculated formula | C44 H56 Ag4 Cl4 N4 O16 S6 |
SMILES | C1CCOc2c(C[S]3[Ag]45ON(=[O][Ag]6([CH]7=CC=C(C[S]8CC[S]4(CC3)[Ag]3(ON(=O)=[O][Ag]48[S]8Cc9c(cccc9)OCCCOC9=C[CH]3=CC=C9C[S]5CC[S]64CC8)ON(=O)=O)C(=C7)O1)ON(=O)=O)=O)cccc2.ClCCl.C(Cl)Cl |
Title of publication | Exo-coordinated discrete and continuous supramolecular silver(i) complexes with thiaoxa-macrocycles |
Authors of publication | Kim, Hyun Jee; Yoon, Il; Lee, So Young; Choi, Kyu Seong; Lee, Shim Sung |
Journal of publication | New Journal of Chemistry |
Year of publication | 2008 |
Journal volume | 32 |
Journal issue | 2 |
Pages of publication | 258 |
a | 9.523 ± 0.0006 Å |
b | 12.0312 ± 0.0007 Å |
c | 14.1546 ± 0.0008 Å |
α | 73.512 ± 0.001° |
β | 86.303 ± 0.001° |
γ | 67.543 ± 0.001° |
Cell volume | 1435.36 ± 0.15 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0296 |
Residual factor for significantly intense reflections | 0.0239 |
Weighted residual factors for significantly intense reflections | 0.0547 |
Weighted residual factors for all reflections included in the refinement | 0.057 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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