Information card for entry 7052676
| Formula |
C20 H20 Cu N2 O2 |
| Calculated formula |
C20 H20 Cu N2 O2 |
| SMILES |
[Cu]12(Oc3ccccc3C=[N]1CC=C)Oc1ccccc1C=[N]2CC=C |
| Title of publication |
Plasma deposited metal Schiff-base compounds as antimicrobials |
| Authors of publication |
Poulter, Neil; Donaldson, Matthew; Mulley, Geraldine; Duque, Luis; Waterfield, Nicholas; Shard, Alex G.; Spencer, Steve; Jenkins, A. Tobias A.; Johnson, Andrew L. |
| Journal of publication |
New Journal of Chemistry |
| Year of publication |
2011 |
| Journal volume |
35 |
| Journal issue |
7 |
| Pages of publication |
1477 |
| a |
10.713 ± 0.0002 Å |
| b |
7.356 ± 0.0001 Å |
| c |
22.324 ± 0.0004 Å |
| α |
90° |
| β |
102.898 ± 0.001° |
| γ |
90° |
| Cell volume |
1714.85 ± 0.05 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0439 |
| Residual factor for significantly intense reflections |
0.0339 |
| Weighted residual factors for significantly intense reflections |
0.0856 |
| Weighted residual factors for all reflections included in the refinement |
0.091 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.039 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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