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Information card for entry 7052767
Preview
Coordinates | 7052767.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H76 P2 |
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Calculated formula | C64 H76 P2 |
SMILES | P(=Cc1ccc(c2c3cc4c(cc3ccc2)cccc4c2ccc(cc2)C=Pc2c(cc(cc2C(C)(C)C)C(C)(C)C)C(C)(C)C)cc1)c1c(C(C)(C)C)cc(cc1C(C)(C)C)C(C)(C)C |
Title of publication | Role of the aromatic bridge on radical ions formation during reduction of diphosphaalkenes |
Authors of publication | Lejeune, Manuel; Grosshans, Philippe; Berclaz, Théo; Sidorenkova, Helena; Besnard, Céline; Pattison, Phil; Geoffroy, Michel |
Journal of publication | New Journal of Chemistry |
Year of publication | 2011 |
Journal volume | 35 |
Journal issue | 11 |
Pages of publication | 2510 |
a | 9.834 ± 0.005 Å |
b | 10.871 ± 0.005 Å |
c | 25.8 ± 0.01 Å |
α | 88.42 ± 0.02° |
β | 83.77 ± 0.02° |
γ | 79.06 ± 0.02° |
Cell volume | 2692 ± 2 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0748 |
Residual factor for significantly intense reflections | 0.0659 |
Weighted residual factors for all reflections | 0.0941 |
Weighted residual factors for significantly intense reflections | 0.0933 |
Weighted residual factors for all reflections included in the refinement | 0.0941 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.1263 |
Diffraction radiation wavelength | 0.7 Å |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7052767.html
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