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Information card for entry 7052790
Preview
Coordinates | 7052790.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C76 H74 N4 P2 Ru |
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Calculated formula | C76 H74 N4 P2 Ru |
SMILES | C1=c2c(c(c3=Cc4c(c(c5=Cc6c(c(c7C=c8c(c(c1[n]8[Ru]([n]45)(n23)(n67)([P](c1ccccc1)(c1ccccc1)C#Cc1ccccc1)[P](c1ccccc1)(c1ccccc1)C#Cc1ccccc1)CC)CC)CC)CC)CC)CC)CC)CC |
Title of publication | Ruthenium(ii) and rhodium(iii) porphyrin phosphine complexes: influence of substitution pattern on structure and electronic properties |
Authors of publication | Bond, Andrew D.; Sanders, Jeremy K. M.; Stulz, Eugen |
Journal of publication | New Journal of Chemistry |
Year of publication | 2011 |
Journal volume | 35 |
Journal issue | 11 |
Pages of publication | 2691 |
a | 11.5833 ± 0.0003 Å |
b | 12.2478 ± 0.0003 Å |
c | 13.1535 ± 0.0003 Å |
α | 96.18 ± 0.001° |
β | 110.866 ± 0.001° |
γ | 113.422 ± 0.001° |
Cell volume | 1530.94 ± 0.07 Å3 |
Cell temperature | 180 ± 2 K |
Ambient diffraction temperature | 180 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.045 |
Residual factor for significantly intense reflections | 0.0366 |
Weighted residual factors for significantly intense reflections | 0.0828 |
Weighted residual factors for all reflections included in the refinement | 0.0868 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7052790.html
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