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Information card for entry 7053543
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| Coordinates | 7053543.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | joerg143 H.Helten ''HHE-298F1'' 100K 13.02.08 |
|---|---|
| Formula | C20 H28 N3 O5 P S Si2 W |
| Calculated formula | C20 H28 N3 O5 P S Si2 W |
| SMILES | [W]([P]1(N=C(N=C1c1sccc1)N(C)C)C([Si](C)(C)C)[Si](C)(C)C)(C#[O])(C#[O])(C#[O])(C#[O])C#[O] |
| Title of publication | Extended π conjugation in 2H-1,4,2-diazaphosphole complexes |
| Authors of publication | Helten, Holger; Daniels, Jörg; Nieger, Martin; Streubel, Rainer |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2010 |
| Journal volume | 34 |
| Journal issue | 8 |
| Pages of publication | 1593 |
| a | 11.8239 ± 0.0002 Å |
| b | 20.2887 ± 0.0005 Å |
| c | 11.927 ± 0.0003 Å |
| α | 90° |
| β | 104.518 ± 0.001° |
| γ | 90° |
| Cell volume | 2769.83 ± 0.11 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0435 |
| Residual factor for significantly intense reflections | 0.029 |
| Weighted residual factors for significantly intense reflections | 0.0511 |
| Weighted residual factors for all reflections included in the refinement | 0.0541 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.983 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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