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Information card for entry 7054232
Preview
| Coordinates | 7054232.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H28 N2 Pd S4 |
|---|---|
| Calculated formula | C16 H28 N2 Pd S4 |
| SMILES | [Pd]12([S]=C(N(C)C3CCCCC3)S1)[S]=C(N(C)C1CCCCC1)S2 |
| Title of publication | Vysotskite structured photoactive palladium sulphide thin films from dithiocarbamate derivatives |
| Authors of publication | Ehsan, Muhammad Ali; Ming, Huang Nay; McKee, Vickie; Peiris, Thalge Anton Nirmal; Wijayantha-Kahagala-Gamage, Upul; Arifin, Zainudin; Mazhar, Muhammad |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2014 |
| Journal volume | 38 |
| Journal issue | 9 |
| Pages of publication | 4083 |
| a | 9.9199 ± 0.0007 Å |
| b | 11.0292 ± 0.0007 Å |
| c | 10.1444 ± 0.0007 Å |
| α | 90° |
| β | 114.696 ± 0.001° |
| γ | 90° |
| Cell volume | 1008.37 ± 0.12 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0327 |
| Residual factor for significantly intense reflections | 0.0262 |
| Weighted residual factors for significantly intense reflections | 0.0623 |
| Weighted residual factors for all reflections included in the refinement | 0.0651 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.063 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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