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Information card for entry 7054287
Preview
| Coordinates | 7054287.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H44 N4 O2 P2 S2 Zn |
|---|---|
| Calculated formula | C22 H44 N4 O2 P2 S2 Zn |
| SMILES | [Zn]12([S]=P(N=C(N3CCCC3)O2)(C(C)C)C(C)C)[S]=P(N=C(N2CCCC2)O1)(C(C)C)C(C)C |
| Title of publication | N-(Chalcogen)phosphorylated (chalcogen)ureas of zinc and cadmium(ii): SSPs for group 12‒16 thin films |
| Authors of publication | Rojas-Montoya, Iván D.; Santana-Silva, Alicia; García-Montalvo, Verónica; Muñoz-Hernández, Miguel-Ángel; Rivera, Margarita |
| Journal of publication | New J. Chem. |
| Year of publication | 2014 |
| Journal volume | 38 |
| Journal issue | 10 |
| Pages of publication | 4702 |
| a | 10.3217 ± 0.0019 Å |
| b | 11.081 ± 0.002 Å |
| c | 13.944 ± 0.003 Å |
| α | 79.689 ± 0.003° |
| β | 86.905 ± 0.003° |
| γ | 64.54 ± 0.003° |
| Cell volume | 1416.2 ± 0.5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0441 |
| Residual factor for significantly intense reflections | 0.0413 |
| Weighted residual factors for significantly intense reflections | 0.1076 |
| Weighted residual factors for all reflections included in the refinement | 0.1092 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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