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Information card for entry 7054426
Preview
Coordinates | 7054426.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C17 H17 N3 S4 |
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Calculated formula | C17 H17 N3 S4 |
SMILES | S=C1SC(SCCC#N)=C(SCCC#N)N1[C@@H](C)c1ccccc1 |
Title of publication | The near infra red (NIR) chiroptical properties of nickel dithiolene complexes |
Authors of publication | Le Gal, Yann; Vacher, Antoine; Dorcet, Vincent; Fourmigué, Marc; Crassous, Jeanne; Lorcy, Dominique |
Journal of publication | New J. Chem. |
Year of publication | 2015 |
Journal volume | 39 |
Journal issue | 1 |
Pages of publication | 122 |
a | 8.5565 ± 0.0003 Å |
b | 11.6085 ± 0.0003 Å |
c | 37.5518 ± 0.001 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3729.95 ± 0.19 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.042 |
Residual factor for significantly intense reflections | 0.0365 |
Weighted residual factors for significantly intense reflections | 0.0756 |
Weighted residual factors for all reflections included in the refinement | 0.078 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7054426.html
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Users of the data should acknowledge the original authors of the
structural data.