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Information card for entry 7054873
Preview
Coordinates | 7054873.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C63 H86 Ce K N6 O4 |
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Calculated formula | C63 H86 Ce K N6 O4 |
SMILES | [Ce]12345([O]6[K]78([O]1c1c(cc(cc1C[N]7(C)C)C)C[N]4(C)C)([O]2c1c(cc(cc1C[N]8(C)C)C)C[N]5(C)C)[N](Cc1c6c(cc(c1)C)C[N]3(C)C)(C)C)Oc1cc2ccccc2cc1.c1(ccccc1)C.c1(ccccc1)C |
Title of publication | Structural variation in cerium aryloxide complexes templated by hemilabile K±-amine interactions |
Authors of publication | Kim, Jee Eon; Carroll, Patrick J.; Schelter, Eric J. |
Journal of publication | New J. Chem. |
Year of publication | 2015 |
Journal volume | 39 |
Journal issue | 8 |
Pages of publication | 6076 |
a | 14.4458 ± 0.0009 Å |
b | 14.7681 ± 0.0009 Å |
c | 15.4079 ± 0.001 Å |
α | 92.43 ± 0.003° |
β | 91.434 ± 0.003° |
γ | 110.149 ± 0.003° |
Cell volume | 3080.4 ± 0.3 Å3 |
Cell temperature | 143 ± 1 K |
Ambient diffraction temperature | 143 ± 1 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0239 |
Residual factor for significantly intense reflections | 0.0215 |
Weighted residual factors for significantly intense reflections | 0.0541 |
Weighted residual factors for all reflections included in the refinement | 0.0559 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.174 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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