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Information card for entry 7054878
Preview
Coordinates | 7054878.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C45 H74 Ce K N6 O4 |
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Calculated formula | C43 H72 Ce K N6 O4 |
SMILES | c12c(cc(cc1C[N]1(C)C)C)C[N](C)(C)[Ce]34([N](Cc5c([O]36)c(cc(c5)C)C[N]3(C)C)(C)C)([O]25)(OC(C)(C)C)[N](C)(C)Cc2c([O]47)c(cc(c2)C)C[N](C)(C)[K]13567 |
Title of publication | Structural variation in cerium aryloxide complexes templated by hemilabile K±-amine interactions |
Authors of publication | Kim, Jee Eon; Carroll, Patrick J.; Schelter, Eric J. |
Journal of publication | New J. Chem. |
Year of publication | 2015 |
Journal volume | 39 |
Journal issue | 8 |
Pages of publication | 6076 |
a | 49.697 ± 0.005 Å |
b | 49.697 ± 0.005 Å |
c | 10.6526 ± 0.0012 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 22785 ± 4 Å3 |
Cell temperature | 143 ± 1 K |
Ambient diffraction temperature | 143 ± 1 K |
Number of distinct elements | 6 |
Space group number | 148 |
Hermann-Mauguin space group symbol | R -3 :H |
Hall space group symbol | -R 3 |
Residual factor for all reflections | 0.1606 |
Residual factor for significantly intense reflections | 0.0649 |
Weighted residual factors for significantly intense reflections | 0.1335 |
Weighted residual factors for all reflections included in the refinement | 0.171 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.8 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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