Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7055668
Preview
Coordinates | 7055668.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C72 H54 Ag2 F4 P4 S2 |
---|---|
Calculated formula | C72 H54 Ag2 F4 P4 S2 |
SMILES | c1(cc(cc(c1)F)F)[S]1[Ag]2([S](c3cc(cc(c3)F)F)[Ag]31[P](c1c(cccc1)[P]3(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1c(cccc1)[P]2(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Luminescent diphosphine fluorophenylthiolate silver(i) compounds that exhibit argentophilic interactions |
Authors of publication | Moreno-Alcántar, Guillermo; Nácar-Anaya, Antonio; Flores-Álamo, Marcos; Torrens, Hugo |
Journal of publication | New J. Chem. |
Year of publication | 2016 |
Journal volume | 40 |
Journal issue | 8 |
Pages of publication | 6577 |
a | 13.8314 ± 0.0008 Å |
b | 13.9584 ± 0.0012 Å |
c | 18.061 ± 0.0011 Å |
α | 73.771 ± 0.006° |
β | 78.567 ± 0.005° |
γ | 63.638 ± 0.007° |
Cell volume | 2988.7 ± 0.4 Å3 |
Cell temperature | 130 ± 2 K |
Ambient diffraction temperature | 130 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0452 |
Residual factor for significantly intense reflections | 0.0319 |
Weighted residual factors for significantly intense reflections | 0.065 |
Weighted residual factors for all reflections included in the refinement | 0.0723 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7055668.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.