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Information card for entry 7055798
Preview
Coordinates | 7055798.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C22 H18 N2 S14 |
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Calculated formula | C22 H18 N2 S14 |
SMILES | S=C1SC2=C(SSC3N([C@H](c4ccccc4)C)C(=S)SC2=3)N1[C@H](c1ccccc1)C.S1SSSSSSS1 |
Title of publication | Chiral 1,2-dithiine as a sulfur rich electron acceptor |
Authors of publication | Le Gal, Yann; Ameline, Dorine; Vacher, Antoine; Roisnel, Thierry; Dorcet, Vincent; Lorcy, Dominique |
Journal of publication | New J. Chem. |
Year of publication | 2016 |
Journal volume | 40 |
Journal issue | 12 |
Pages of publication | 9930 |
a | 8.4463 ± 0.0002 Å |
b | 15.31 ± 0.0004 Å |
c | 23.6692 ± 0.0007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3060.73 ± 0.14 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0358 |
Residual factor for significantly intense reflections | 0.0302 |
Weighted residual factors for significantly intense reflections | 0.0631 |
Weighted residual factors for all reflections included in the refinement | 0.0651 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7055798.html
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