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Information card for entry 7056476
Preview
Coordinates | 7056476.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C86 H64 N6 P4 S6 W |
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Calculated formula | C86 H64 N6 P4 S6 W |
SMILES | C1(S[W]23(SC(C#N)=C(S2)C#N)(Sc2c(cccc2)S3)SC=1C#N)C#N.c1(ccccc1)P(=N[P+](c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1.c1(ccccc1)P(=N[P+](c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Mononuclear Bis(dithiolene) Mo(IV) and W(IV) Complexes with P, P; S, S; O, S and O, O Donor Ligands: A Comparative Reactivity Study |
Authors of publication | Khatua, Suman; Naskar, Tilak; Nandi, Chandan; Majumdar, Amit |
Journal of publication | New J. Chem. |
Year of publication | 2017 |
a | 17.662 ± 0.003 Å |
b | 10.529 ± 0.002 Å |
c | 22.676 ± 0.004 Å |
α | 90° |
β | 109.361 ± 0.004° |
γ | 90° |
Cell volume | 3978.4 ± 1.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 13 |
Hermann-Mauguin space group symbol | P 1 2/n 1 |
Hall space group symbol | -P 2yac |
Residual factor for all reflections | 0.0478 |
Residual factor for significantly intense reflections | 0.0363 |
Weighted residual factors for significantly intense reflections | 0.0789 |
Weighted residual factors for all reflections included in the refinement | 0.0842 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.018 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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