Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7059444
Preview
| Coordinates | 7059444.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H15 Cl2 N3 Ni O2 |
|---|---|
| Calculated formula | C15 H15 Cl2 N3 Ni O2 |
| SMILES | [Ni]12(Cl)([OH2])([OH2])[n]3ccccc3c3[n]1c(c1[n]2cccc1)ccc3.[Cl-] |
| Title of publication | Supramolecular and theoretical perspectives of 2,2′:6′,2′′-terpyridine based Ni(ii) and Cu(ii) complexes: on the importance of C‒H⋯Cl and π⋯π interactions |
| Authors of publication | Pal, Pampi; Das, Kinsuk; Hossain, Anowar; Frontera, Antonio; Mukhopadhyay, Subrata |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2020 |
| Journal volume | 44 |
| Journal issue | 18 |
| Pages of publication | 7310 - 7318 |
| a | 12.485 ± 0.006 Å |
| b | 9.687 ± 0.004 Å |
| c | 14.318 ± 0.006 Å |
| α | 90° |
| β | 105.29 ± 0.015° |
| γ | 90° |
| Cell volume | 1670.4 ± 1.3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.04 |
| Residual factor for significantly intense reflections | 0.0273 |
| Weighted residual factors for significantly intense reflections | 0.0934 |
| Weighted residual factors for all reflections included in the refinement | 0.1204 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.893 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7059444.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.