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Information card for entry 7060607
Preview
Coordinates | 7060607.cif |
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Original paper (by DOI) | HTML |
Formula | C24 H22 O S2 |
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Calculated formula | C24 H22 O S2 |
SMILES | C(=O)(CCCCC)c1ccc(c2ccc(c3cc4ccccc4cc3)s2)s1 |
Title of publication | Effect of electron-withdrawing groups on molecular properties of naphthyl and anthryl bithiophenes as potential n-type semiconductors |
Authors of publication | Feriancová, Lucia; Cigáň, Marek; Gmucová, Katarína; Kožíšek, Jozef; Nádaždy, Vojtech; Putala, Martin |
Journal of publication | New Journal of Chemistry |
Year of publication | 2021 |
Journal volume | 45 |
Journal issue | 22 |
Pages of publication | 9794 - 9804 |
a | 41.2198 ± 0.0006 Å |
b | 5.8202 ± 0.0001 Å |
c | 8.0162 ± 0.0002 Å |
α | 90° |
β | 90.988 ± 0.001° |
γ | 90° |
Cell volume | 1922.86 ± 0.06 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0307 |
Residual factor for significantly intense reflections | 0.0296 |
Weighted residual factors for significantly intense reflections | 0.0782 |
Weighted residual factors for all reflections included in the refinement | 0.0788 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54186 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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