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Information card for entry 7063257
Preview
Coordinates | 7063257.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H58 Ag In P2 Se4 |
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Calculated formula | C64 H58 Ag In P2 Se4 |
Title of publication | [(Ph3P)2Ag(μ-SeCH2Ph)2In(SeCH2Ph)2]: A New Heterobimetallic Single Source Precursor As a Springboard to Bulk, Nano and Thin Film of Ternary AgInSe2 Material |
Authors of publication | Karmakar, Gourab; Tyagi, Adish; Tyagi, Deepak; Shah, Alpa Y.; Wadawale, A. P.; Donthula, Harish; Singh, Vishal |
Journal of publication | New Journal of Chemistry |
Year of publication | 2024 |
a | 22.8804 ± 0.0007 Å |
b | 13.3317 ± 0.0003 Å |
c | 20.976 ± 0.0007 Å |
α | 90° |
β | 110.3 ± 0.003° |
γ | 90° |
Cell volume | 6001 ± 0.3 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0569 |
Residual factor for significantly intense reflections | 0.0342 |
Weighted residual factors for significantly intense reflections | 0.065 |
Weighted residual factors for all reflections included in the refinement | 0.07 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7063257.html
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