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Information card for entry 7103890
Preview
| Coordinates | 7103890.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H40 Au2 P2 Te4 |
|---|---|
| Calculated formula | C48 H40 Au2 P2 Te4 |
| SMILES | c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1.[Au]12[Au]([Te][Te]1)[Te][Te]2.c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | [TeSe~3~]^2-^ and [TeSe~2~]^2^ as synthons |
| Authors of publication | Dibrov, Sergey M.; Ibers, James A. |
| Journal of publication | Chemical Communications (Cambridge, United Kingdom) |
| Year of publication | 2003 |
| Journal issue | 17 |
| Pages of publication | 2158 - 2159 |
| a | 10.4984 ± 0.0011 Å |
| b | 10.526 ± 0.0011 Å |
| c | 11.1529 ± 0.0011 Å |
| α | 81.459 ± 0.002° |
| β | 77.221 ± 0.002° |
| γ | 72.994 ± 0.002° |
| Cell volume | 1144.7 ± 0.2 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0393 |
| Residual factor for significantly intense reflections | 0.0265 |
| Weighted residual factors for significantly intense reflections | 0.0645 |
| Weighted residual factors for all reflections included in the refinement | 0.0703 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7103890.html
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