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Information card for entry 7105222
Preview
Coordinates | 7105222.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H38 N2 O4 Ru2 Si4 |
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Calculated formula | C26 H38 N2 O4 Ru2 Si4 |
SMILES | [Ru]123([Si](C)(C)[Ru]4([Si]3(Cc5[n]1c(C[Si]2(C)C)ccc5)(C)Cc1[n]4c(ccc1)C[Si](C)(C)C)(C#[O])C#[O])(C#[O])C#[O] |
Title of publication | Thermal reaction of a ruthenium bis(silyl) complex having a lutidine-based Si,N,Si ligand: formation of a mu-silyl(mu-silylene) diruthenium complex involving a 3c-2e Ru-Si-C interaction. |
Authors of publication | Komuro, Takashi; Tobita, Hiromi |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2010 |
Journal volume | 46 |
Journal issue | 7 |
Pages of publication | 1136 - 1137 |
a | 10.5784 ± 0.0005 Å |
b | 13.6191 ± 0.0005 Å |
c | 22.5534 ± 0.0009 Å |
α | 90° |
β | 99.2293 ± 0.0018° |
γ | 90° |
Cell volume | 3207.2 ± 0.2 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0491 |
Residual factor for significantly intense reflections | 0.038 |
Weighted residual factors for significantly intense reflections | 0.0876 |
Weighted residual factors for all reflections included in the refinement | 0.0976 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.316 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7105222.html
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