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Information card for entry 7105294
Preview
Coordinates | 7105294.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H58 N2 P4 S2 Si2 Sn2 |
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Calculated formula | C56 H58 N2 P4 S2 Si2 Sn2 |
SMILES | C12=P(c3ccccc3)(c3ccccc3)N([Si](C)(C)C)[Sn]1[S]=P(C1=P(c3ccccc3)(c3ccccc3)N([Si](C)(C)C)[Sn]1[S]=P2(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Synthesis and characterization of a tin(II) bis(phosphinoyl)methanediide complex: a stannavinylidene derivative. |
Authors of publication | Guo, Jiayi; Lau, Kai-Chung; Xi, Hong-Wei; Lim, Kok Hwa; So, Cheuk-Wai |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2010 |
Journal volume | 46 |
Journal issue | 11 |
Pages of publication | 1929 - 1931 |
a | 10.621 ± 0.0002 Å |
b | 12.6848 ± 0.0003 Å |
c | 20.977 ± 0.0005 Å |
α | 90° |
β | 101.344 ± 0.001° |
γ | 90° |
Cell volume | 2770.92 ± 0.11 Å3 |
Cell temperature | 143 ± 2 K |
Ambient diffraction temperature | 143 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0431 |
Residual factor for significantly intense reflections | 0.0268 |
Weighted residual factors for significantly intense reflections | 0.0667 |
Weighted residual factors for all reflections included in the refinement | 0.0793 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.121 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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