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Information card for entry 7105328
Preview
Coordinates | 7105328.cif |
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Original paper (by DOI) | HTML |
Formula | C64 H56 P4 Se6 Sn |
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Calculated formula | C64 H56 P4 Se6 Sn |
SMILES | C12=P([Se][Sn]34([Se]1)([Se]=P(C(=P([Se]3)(c1ccccc1)c1ccccc1)[Se]4)(c1ccccc1)c1ccccc1)[Se]=P2(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1.c1(ccccc1)C.c1(ccccc1)C |
Title of publication | Novel carbon-centred reactivity of [(H)C(PPh2Se)2]- in the formation of structurally diverse Sn(IV), Te(IV) and Hg(II) complexes of the triseleno ligand [(Se)C(PPh2Se)2]2-. |
Authors of publication | Konu, Jari; Chivers, Tristram |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2010 |
Journal volume | 46 |
Journal issue | 9 |
Pages of publication | 1431 - 1433 |
a | 15.803 ± 0.003 Å |
b | 11.518 ± 0.002 Å |
c | 16.376 ± 0.003 Å |
α | 90° |
β | 91.7 ± 0.03° |
γ | 90° |
Cell volume | 2979.4 ± 0.9 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0603 |
Residual factor for significantly intense reflections | 0.0488 |
Weighted residual factors for significantly intense reflections | 0.1209 |
Weighted residual factors for all reflections included in the refinement | 0.1287 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7105328.html
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