Information card for entry 7106558

Structure parameters

• Formula: C44 H63 Cl Ge2 N4
• Calculated formula: C44 H63 Cl Ge2 N4
• SMILES: [Ge]1(Cl)N(C(=CC(=[N]1c1c(cccc1C(C)C)C(C)C)C[Ge]1[N](=C(N1C(C)(C)C)c1ccccc1)C(C)(C)C)C)c1c(cccc1C(C)C)C(C)C
• Title of publication: Elegant approach to spacer arranged silagermylene and bis(germylene) compounds
• Authors of publication: Sankaranarayana Pillai Sarish; Sakya S. Sen; Herbert W. Roesky; Ina Objartel; Dietmar Stalke
• Journal of publication: Chem.Commun.
• Year of publication: 2011
• Journal volume: 47
• Pages of publication: 7206
• a: 13.207 ± 0.002 Å
• b: 22.515 ± 0.003 Å
• c: 15.273 ± 0.002 Å
• α: 90°
• β: 106.601 ± 0.002°
• γ: 90°
• Cell volume: 4352.2 ± 1 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0459
• Residual factor for significantly intense reflections: 0.0325
• Weighted residual factors for significantly intense reflections: 0.0642
• Weighted residual factors for all reflections included in the refinement: 0.069
• Goodness-of-fit parameter for all reflections included in the refinement: 1.038
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No