Information card for entry 7107949

Structure parameters

• Formula: C36 H108 Si16 Sn4 Te6
• Calculated formula: C36 H108 Si16 Sn4 Te6
• SMILES: C[Si](C)(C)[Si]([Si](C)(C)C)([Si](C)(C)C)[Te][Sn]1[Te]([Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[Sn]2[Te]1[Sn]1[Te]([Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[Sn]([Te][Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[Te]21
• Title of publication: Cyclic and polycyclic tellurium-tin and tellurium-lead compounds ‒ synthesis, structures and thermal decomposition
• Authors of publication: Stephan Traut; Carsten von Hanisch; Alexander Peter Hahnel; Sven Stahl
• Journal of publication: Chem.Commun.
• Year of publication: 2012
• Journal volume: 48
• Pages of publication: 6984
• a: 9.5474 ± 0.0019 Å
• b: 26.049 ± 0.005 Å
• c: 17.285 ± 0.004 Å
• α: 90°
• β: 91.7 ± 0.03°
• γ: 90°
• Cell volume: 4296.9 ± 1.6 ų
• Cell temperature: 180 ± 2 K
• Ambient diffraction temperature: 180 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.054
• Residual factor for significantly intense reflections: 0.0411
• Weighted residual factors for significantly intense reflections: 0.0939
• Weighted residual factors for all reflections included in the refinement: 0.0988
• Goodness-of-fit parameter for all reflections included in the refinement: 1.052
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No